by Keyword: Micro-nano manipulation
Muñoz, Luis Miguel, Casals, Alícia, Amat, Josep, Puig-Vidal, Manel, Samitier, Josep, (2005). Improved AFM scanning methodology with adaptation to the target shape C3 - Proceedings - IEEE International Conference on Robotics and Automation ICRA 2005 
2005 IEEE International Conference on Robotics and Automation , IEEE (Barcelona, Spain) , 1529-1534
This paper presents a manipulation and measurement aid for tasks carried out in micro-nano environments operating with scanning AFM. In teleoperated manipulation or measurement over a given point of the target, where a slow and precise movement is necessary, the developed system increases the accuracy in this point producing a space deformation. In automatic scanning, the adjusted selection of the target, through assisted image segmentation, enables to reduce the working time.
JTD Keywords: Assisted teleoperation, Image segmentation, Micro-nano manipulation, Workspace deformation
