Publications

Abstract Here, we devise a conductive Atomic Force Microscope (C-AFM) based on quartz tuning forks (QTFs) and metallic tips capable of simultaneously imaging the topography and conductance of a sample with nanoscale spatial resolution. The system is based on a header design which allows the metallic tip to be placed in tight and stable mechanical contact with the QTF without the need to use any glue. This allows electrical measurements to be taken with an electrically excited QTF with the two prongs free. The amplitude oscillation of the QTF is used to control the tip-sample distance and to acquire the topographic images. Meanwhile, the metallic tip is connected to a current–voltage amplifier circuit to measure the tip-sample field emission/tunneling current and to produce the conductive images. This method allows decoupled electrical measurement of the topography and electrical properties of the sample. The results we obtain from calibration samples demonstrate the feasibility of this measurement method and the adequacy of the performance of the system.

JTD Keywords: AFM, Conductive AFM, Quartz tuning fork

We show that optical visualization of ultrathin mica flakes on metallic substrates is viable using semitransparent gold as substrates. This enables to easily localize mica flakes and rapidly estimate their thickness directly on gold substrates by conventional optical reflection microscopy. We experimentally demonstrate it by comparing optical images with atomic force microscopy images of mica flakes on semitransparent gold. Present results open the possibility for simple and rapid characterization of thin mica flakes as well as other thin sheets directly on metallic substrates.

JTD Keywords: Atomic force, Conductive AFM, Gold substrates, Metallic substrate, Optical image, Optical reflection, Optical visualization, Ultrathin layers, Atomic force microscopy, Geometrical optics, Gold, Mica, Optical microscopy, Substrates